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Probabilistic Modeling of Radiation Damage in Charge-Coupled Devices

by D. H. Ebbeler,
L. E. Newlin,
N. R. Moore,



Document Type: Proceeding Paper

Part of: Probabilistic Mechanics & Structural Reliability

Subject Headings: Radiation | Probability | Electrical equipment | Equipment and machinery

Services: Buy this book/Buy this article

 

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