Reliability of Identical Brittle Parallel Systemby J. H. Lee, Tokyo Metropolitan Univ, Japan,
S. Terada, Tokyo Metropolitan Univ, Japan,
T. Takahashi, Tokyo Metropolitan Univ, Japan,
Document Type: Proceeding Paper
Abstract: The failure path of a system can be investigated through the use of a failure graph, which is a directed graph of all possible sequences of element failures. This paper describes the development of a simple formula to estimate the reliability of identical brittle parallel system by using the cut-set which is based on the failure graph theory. Approximate solutions that use only a limited number of cut-sets are investigated to examine the probable errors associated with these abbreviations. The method is also applied to the reliability evaluation of test-proven systems.
Subject Headings: Failure analysis | System reliability | Brittleness | Structural reliability | Structural analysis | Graphic methods | Material failures
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