Book Review: Patent Failure: How Judges, Bureaucrats, and Lawyers Put Innovators at Risk by James Bessen and Michael J. Meurer. Princeton, New Jersey: Princeton University Press, 2008
by Ray Bert, Contributing Editor; Serial Information: Civil Engineering—ASCE, 2008, Vol. 78, Issue 6, Pg. 73-73
Document Type: Book Review - Magazine
Subject Headings: Reviews | Legal affairs | Failure analysis | Colleges and universities
Services: Buy this book/Buy this article
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