Cement and Concrete Characterization by Scanning Electron Microscopy

by Paul Stutzman, Natl Inst of Standards and, Technology, Gaithersburg, United States,

Document Type: Proceeding Paper

Part of: Mechanics Computing in 1990's and Beyond


The scanning electron microscope (SEM) is a powerful tool for the microstructural and chemical characterization of cement and concrete. Imaging techniques such as secondary electron, backscattered electron, and X-ray imaging provide information about surface texture, microstructure, aggregates, and the air void system. X-ray microanalysis is useful for qualitative and quantitative chemical analysis and X-ray mapping of element distribution. Image processing and analysis is used for quantification of microstructural features. The linking of these operations will provide automated, quantitative, and consistent analysis of portland cement and concrete.

Subject Headings: Computer vision and image processing | Concrete | Cement | Materials characterization | X rays | Microstructure | Material properties | Chemical elements

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