A New Dielectric Instrument for Statistical Process Control of RIM, SMC, and RTM Processes
by David R. Day,Huan L. Lee,
David D. Shepard,
Norman F. Sheppard,
Document Type: Proceeding Paper
Part of: Advanced Composites Materials in Civil Engineering Structures
Subject Headings: Materials processing | Statistics | Composite materials | Synthetic materials | Polymer | Instrumentation | Curing
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