Probabilistic Fatigue Life Analysis of High Density Electronics Packaging

by N. R. Moore,
E. A. Kolawa,
S. Sutharshana,
L. E. Newlin,
M. Creager,

Document Type: Proceeding Paper

Part of: Probabilistic Mechanics & Structural Reliability

Subject Headings: Finite element method | Thermal loads | Cracking | Electronic equipment | Fatigue life | Lifeline systems | Probability

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