Electrical In Situ Measurements for Predicting Behavior of Soilsby A. Anandarajah, Johns Hopkins Univ, Baltimore, MD, USA,
N. J. Meegoda, Johns Hopkins Univ, Baltimore, MD, USA,
K. Arulanandan, Johns Hopkins Univ, Baltimore, MD, USA,
Abstract: A new method is presented for predicting the in situ stress-strain behavior of fine grained soils based upon in situ measurements of its electrical properties. The method involves the selection of an accurate constitutive model and the evaluation of model parameters required via correlations between electrical and mechanical parameters. A bounding surface elasto-plastic model is chosen for this study and correlations have been established for model parameters which control the behavior of normally consolidated soils. The method is verified by making field measurements of electrical properties at a site containing copper mine tailings.
Subject Headings: Field tests | Terrain models | Soil stress | Model accuracy | Parameters (statistics) | Correlation | Model analysis
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