Statistics of Random Loading with Fatigue

by Jann-Nan Yang, (A.M.ASCE), NRC-AFML Sr. Res. Assoc.; Air Force Materials Lab., AFML/LL, Wright-Patterson Air Force Base, OH,


Serial Information: Journal of the Engineering Mechanics Division, 1974, Vol. 100, Issue 3, Pg. 469-475


Document Type: Journal Paper

Abstract: Under random excitation, the fatigue crack growth of a structure depends primarily on the statistics of rises and falls of the random response process. Based on the envelope statistics, a close-form solution, expressed in terms of the hypergeometric function, for approximating the rise and fall statistics of random processes is presented. The solution is very simple to compute and its accuracy is very satisfactory when the random response process is reasonably narrow band.

Subject Headings: Statistics | Fatigue (material) | Excitation (physics) | Cracking | Building envelope | Probability | Load factors

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